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Showing results: 1591 - 1605 of 17152 items found.

Fiber Geometry System

FGC-GT - Arden Photonics LTD

The FGC range is the complete solution for measuring the dimensions of standard and speciality fiber in both production and R&D environments. FGC-GT – fiber glass geometry for fibers up to 400 µm diameter.

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VLSI Test Systems

Chroma ATE Inc.

50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P

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Regenerative Battery Pack Test System

17020E - Chroma ATE Inc.

Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel

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Regenerative Battery Pack Test System

17040E - Chroma ATE Inc.

High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions

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V4 Marine Communications System - V4 NAVTEX Test System

ICS Electronics Ltd.

The ICS Electronics Limited V4 NAVTEX Test system may be used for type approval, general performance testing and production testing of NAVTEX receivers.

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PHIL System (Power Hardware In-Loop System) Case Study

Ponovo Power Co., Ltd.

In the PHIL (Power Hardware In-Loop) Case Study, the PHIL system consists of a PONOVO 4-Q amplifier, RTDS simulator, DC electronic load unit and PV inverter.

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6U VPX Direct RF Processing System

VP460 - Abaco Systems Inc

The VP460 is designed to enable customers to begin development of their next generation systems using revolutionary new processor technology. It is in alignment with the SOSA™ Technical Standard to provide the interoperability required by the US Air Force, Army and Navy.

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COMPUTERIZED LCRTZ TEST SYSTEM (Automatic Transformer Test System)

CVCT-S20 - Vasavi Electronics

Ideal for fast and fool proof testing of COILS AND SMALL TRANSFORMERS like SMPS transformers, Telecom transformers (HYBRID, POT CORE, RM-CORE), Pulse transformers etc. The systems scans at one stroke, all the windings of a transformer and tests as per definition of test procedure. The test procedure can be pre-programmed and stored under User friendly menu driven software . Any semi-skilled and unskilled person can be engaged for actual testing purpose. Can Select test frequency, pin number, parameters, test conditions, limits for each test. Test any pin to any other pin any defined parameter.Test Parameters :-> Inductance-> Capacitance-> AC Resistance, -> DC Resistance, -> Impedance, -> Leakage Inductance,-> Transformation Ratio & Winding PolaritySPECIFICATIONS :Measurement Frequencies : 50 Hz, 100 Hz, 500 Hz, 800 Hz; 1 KHz, 2 KHz, 5 KHz, 10 KHz. Measurement Voltage: 0.1 V – 1.0 V RMS adjustable under program control.

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Radio Frequency, Communications, & Navigation Test Systems

Astronics Corporation

Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.

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Laser Diode Reliability Burn-In / Life-Test System

58602 - Chroma ATE Inc.

Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.

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Laser Diode Burn-in Reliability Test System

58604 - Chroma ATE Inc.

The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.

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Cobra Temperature Forcing System for ATE/SLT Test Applications

31000R - Chroma ATE Inc.

Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.

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Cylindrical Battery Cell Automated Optical Inspection System

7505-K006 - Chroma ATE Inc.

The Chroma 7505-K006 Cylindrical Battery Cell Automated Optical Inspection System equipped with high-resolution camera can perform 2D defect detection that is suitable for inspecting various sizes of cylindrical batteries on the mainstream market.

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Inline Printing Quality Automated Optical Inspection System

7505-K009 - Chroma ATE Inc.

The Chroma 7505-K009 Inline Printing Quality Automated Optical Inspection System equipped with high-resolution camera can perform 2D defect detection that is suitable for Roll to Roll processing and on-line control. Both front and rear sides can be inspected at the same time.

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Partial Discharge Detecting Systems

Hangzhou Xihu Electronic Institute

Cable PD detecting and positioning system, transformer PD detecting and positioning system, switchgear PD detecting and positioning system, GIS PD detecting and positioning systems.

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Filter Results By:

Products

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Manufacturers

Fiber Geometry System

VLSI Test Systems

Regenerative Battery Pack Test System

Regenerative Battery Pack Test System

V4 Marine Communications System - V4 NAVTEX Test System

PHIL System (Power Hardware In-Loop System) Case Study

6U VPX Direct RF Processing System

COMPUTERIZED LCRTZ TEST SYSTEM (Automatic Transformer Test System)

Radio Frequency, Communications, & Navigation Test Systems

Laser Diode Reliability Burn-In / Life-Test System

Laser Diode Burn-in Reliability Test System

Cobra Temperature Forcing System for ATE/SLT Test Applications

Cylindrical Battery Cell Automated Optical Inspection System

Inline Printing Quality Automated Optical Inspection System

Partial Discharge Detecting Systems